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Great success of Innovalia Metrology at Control Fair

2月 7, 2014 | イベント

[lead]Innovalia Metrology presented Ms Portable and its latest products and solutions at Control Fair, held in Stuttgart, from 14 to 17 May. The metrological unit of Innovalia had a booth in the Hall 5, stand 5120, where visitors found the latest developments and metrological solutions suitable for areas such as rail, aeronautics, automotion and wind industry.
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During the Fair, we gave the following presentation in our booth:

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  • Tetrachek CMM: An innovative system developed by Innovalia Metrology for quick system-testing, specially designed for immediate checking of three-dimensional machine state and linear errors evolution.
  • M3 Experience: An exclusive group of experts participating in the development of a new generation of tools for digital production and quality management.
  • Metromeet: The only European Conference on Industrial Dimensional Metrology, consolidated after 9 editions as a forum for debate on metrology and its development in a fast changing industry.

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