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Great success of Innovalia Metrology at the Control Fair

May 5, 2014 | Events

Innovalia Metrology has participated at the Control Fair in Stuttgart (Germany), which ran from 6th to 9th May 2014. Located in Hall 5, Stand 5120, Innovalia Metrology presented the latest metrology solutions and products. The visitors discovered M3 portable, a high definition standalone 3D scanning system, Tetracheck, the most effective and innovative verification system for your coordinate measurement machine, and Optiscan, whose unique design allows the integration into any system for both laboratory and in-line manufacturing.

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Upcoming stops before the end of the year

Upcoming stops before the end of the year

2025 is coming to an end, but we still have a couple of key destinations to visit on our international calendar. At Innovalia Metrology, we will close the year by strengthening our presence at two strategic events that will allow us to continue bringing our advanced...